Search Results - Nel, J.M.

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    Electrical characterization of process, annealing and irradiation induced defects in ZnO

    Published 2013
    Other Authors: “…Nel, J.M.…”
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    Electrical characterization of process-induced defects in 4H-SiC

    Published 2019
    Other Authors: “…Nel, J.M.…”
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    Fabrication and characterization of rare-earth (Ce Sm) doped ZnO nanomaterials for use in electronic devices

    Published 2020
    Other Authors: “…Nel, J.M.…”
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    Characterization of electrical properties and defects in Er- and Yb-doped ZnO thin films grown by sol-gel spin coating

    Published 2023
    Other Authors: “…Nel, J.M.…”
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    Electrical characterization of Al-doped GaN thin films deposited by electrodeposition

    Published 2023
    Other Authors: “…Nel, J.M.…”
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