Naidoo, J. N., & Wyngaard, J. (2022). Characterizing Single Event Upsets within the lpGBT-based End-of-Substructure Card. Department of Electrical Engineering.
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Chicago Style (17th ed.) Citation
Naidoo, Joash Nicholas, and Janet Wyngaard. Characterizing Single Event Upsets Within the LpGBT-based End-of-Substructure Card. Department of Electrical Engineering, 2022.
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MLA (9th ed.) Citation
Naidoo, Joash Nicholas, and Janet Wyngaard. Characterizing Single Event Upsets Within the LpGBT-based End-of-Substructure Card. Department of Electrical Engineering, 2022.
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Warning: These citations may not always be 100% accurate.