Ramukosi, F. L., & Britton, D. T. (2014). Microstructure and residual stress in hydrogenated amorphous silicon (a-Si: H) layers. Department of Physics.
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Chicago Style (17th ed.) Citation
Ramukosi, Fhatuwani Lawrence, and David T. Britton. Microstructure and Residual Stress in Hydrogenated Amorphous Silicon (a-Si: H) Layers. Department of Physics, 2014.
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MLA (9th ed.) Citation
Ramukosi, Fhatuwani Lawrence, and David T. Britton. Microstructure and Residual Stress in Hydrogenated Amorphous Silicon (a-Si: H) Layers. Department of Physics, 2014.
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Warning: These citations may not always be 100% accurate.