(2026). Physics‐Informed LSTM for Degradation Prediction of Metallised Film Capacitors Under Dynamic Stress. IET Power Electronics.
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Chicago Style (17th ed.) Citation
"Physics‐Informed LSTM for Degradation Prediction of Metallised Film Capacitors Under Dynamic Stress."
IET Power Electronics 2026.
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MLA (9th ed.) Citation
"Physics‐Informed LSTM for Degradation Prediction of Metallised Film Capacitors Under Dynamic Stress."
IET Power Electronics, 2026.
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Warning: These citations may not always be 100% accurate.