Laplace deep-level transient spectroscopy studies of the divacancy in alpha-particle irradiated silicon

Subjects: “…Deep-level transient spectroscopy (DLTS)…”
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Characterization of process and radiation induced defects in Si and Ge using conventional deep level transient spectroscopy (DLTS) and Laplace-DLTS

Subjects: “…Dlts…”
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Digital DLTS studies on radiation induced defects in Si, GaAs and GaN

Subjects: “…Digital dlts studies…”
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Electrical characterisation of particle irradiated 4H-SiC

Subjects: “…DLTS…”
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Electrical characterization of Al-doped GaN thin films deposited by electrodeposition

Subjects: “…DLTS…”
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Electrical characterization of process, annealing and irradiation induced defects in ZnO

Subjects: “…Dlts…”
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The effect of palladium deposition on electrically active defects in irradiated silicon

Subjects: “…DLTS…”
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