Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment by Wael, Mohamed

“…Then, the flow searches for the most sensitive path from the node under test to an observable primary output while measuring the minimal SET pulse characteristics that would produce SEUs. This approach also suggests a new enhanced metric is to identify which test vector enhances the propagated SET pulse within a combinational circuit, which is vital to find worst-case test vectors.…”
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