Stochastic Worst-Case Test Vectors for ASIC Devices in Single Event Environment by Hemeda, Mostafa

Subjects: “…single-event effects…”
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Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment by Wael, Mohamed

Subjects: “…single event effects; single event upset; SET fault; ASIC; CMOS; SET sensitivity; reliability; worst-case test vector; space environment;…”
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Establishing a viable and reliable proton-induced single event effect test methodology and environment at iThemba LABS in South Africa by Barnard, Arno

Subjects: “…Single event effect…”
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