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The topology and electrical properties of nanoparticle networks

Includes bibliographical references.

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Bibliographic Details
Main Author: Jonah, Emmanuel Ohieku
Other Authors: Britton, David T
Format: Thesis
Language:English
Published: Department of Physics 2014
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access_status_str Open Access
author Jonah, Emmanuel Ohieku
author2 Britton, David T
author_browse Britton, David T
Jonah, Emmanuel Ohieku
author_facet Britton, David T
Jonah, Emmanuel Ohieku
author_sort Jonah, Emmanuel Ohieku
collection Thesis
description Includes bibliographical references.
format Thesis
id oai:open.uct.ac.za:11427/8806
institution University of Cape Town (South Africa)
language eng
last_indexed 2026-06-10T12:50:17.028Z
license_str Not specified — see source repository
provenance_str_mv Harvested via OAI-PMH from UCTD — University of Cape Town Open Access Repository
publishDate 2014
publishDateRange 2014
publishDateSort 2014
publisher Department of Physics
publisherStr Department of Physics
record_format dspace
source_str UCTD — University of Cape Town Open Access Repository
spelling oai:open.uct.ac.za:11427/8806 The topology and electrical properties of nanoparticle networks Jonah, Emmanuel Ohieku Britton, David T Härting, Margit Includes bibliographical references. The bulk and surface network topologies of milled silicon nanoparticle aggregates in layers deposited on porous and non-porous substrates have been quantitatively characterised using laboratory and synchrotron based small angle X-ray scattering and ultra-small angle X-ray scattering, as well as with a new surface scattering technique developed for this research, which can be described as wide angle low q scattering. A new scaling model applied to the small angle and ultra-small angle X-ray scattering data which was originally developed to describe branched polymers was shown to be applicable to the description of the networks of silicon particles. The milled particles which have a highly polydisperse size distribution, form agglomerates, which in turn cluster to form larger structures with a very high degree of aggregation. Results from the new scattering technique showed the rough surface of the printed layers to have a fractal structure with step heights of 10% to 20% between adjacent particles. This value is consistent with the topology of the particle aggregates in the layer inferred from ultra-small angle X-ray scattering. Flow properties of the inks on different substrates lead to quantitative differences in the mean aggregate separation, with slowly curing systems on materials which allow good capillary flow resulting in denser networks with smaller aggregates and better contact between particles. The electrical conductance of the layers was shown to be linearly related to parallel connections of the minimum paths of particles through the aggregates as determined from the analysis of ultra-small angle X-ray scattering data. The capacitance of the layers was shown to have a linear dependence on both the separation between primary particles and series connection of the minimum paths. 2014-10-27T19:36:08Z 2014-10-27T19:36:08Z 2014 Doctoral Thesis Doctoral PhD http://hdl.handle.net/11427/8806 eng application/pdf Department of Physics Faculty of Science University of Cape Town
spellingShingle Jonah, Emmanuel Ohieku
The topology and electrical properties of nanoparticle networks
thesis_degree_str Doctoral
title The topology and electrical properties of nanoparticle networks
title_full The topology and electrical properties of nanoparticle networks
title_fullStr The topology and electrical properties of nanoparticle networks
title_full_unstemmed The topology and electrical properties of nanoparticle networks
title_short The topology and electrical properties of nanoparticle networks
title_sort topology and electrical properties of nanoparticle networks
url http://hdl.handle.net/11427/8806
work_keys_str_mv AT jonahemmanuelohieku thetopologyandelectricalpropertiesofnanoparticlenetworks
AT jonahemmanuelohieku topologyandelectricalpropertiesofnanoparticlenetworks