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A Dynamic Diagnosis Method for Separating Bond‐Wires Fatigue and Gate Oxide Degradation of SiC MOSFETs
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| Published in: | IET Power Electronics |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| _version_ | 1871837794428518400 |
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| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IET Power Electronics |
| description | |
| discipline_display | Energy |
| discipline_facet | Energy |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:106320 |
| institution | FRELIP |
| journal_source_facet | IET Power Electronics |
| last_indexed | 2026-07-27T03:40:28.993Z |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | A Dynamic Diagnosis Method for Separating Bond‐Wires Fatigue and Gate Oxide Degradation of SiC MOSFETs Energy General Energy |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Energy General Energy |
| subject_facet | Energy General Energy |
| title | A Dynamic Diagnosis Method for Separating Bond‐Wires Fatigue and Gate Oxide Degradation of SiC MOSFETs |
| title_alt | Un Método de Diagnóstico Dinámico para Separar la Fatiga de los Hilos de Unión y la Degradación del Óxido de Puerta de MOSFETs de SiC Une méthode de diagnostic dynamique pour séparer la fatigue des fils de liaison et la dégradation de l'oxyde de grille des MOSFET SiC Um Método de Diagnóstico Dinâmico para Separar Fadiga de Fios de Ligação e Degradação do Óxido de Porta de MOSFETs de SiC |
| title_auth | A Dynamic Diagnosis Method for Separating Bond‐Wires Fatigue and Gate Oxide Degradation of SiC MOSFETs |
| title_es_txt | Un Método de Diagnóstico Dinámico para Separar la Fatiga de los Hilos de Unión y la Degradación del Óxido de Puerta de MOSFETs de SiC |
| title_fr_txt | Une méthode de diagnostic dynamique pour séparer la fatigue des fils de liaison et la dégradation de l'oxyde de grille des MOSFET SiC |
| title_full | A Dynamic Diagnosis Method for Separating Bond‐Wires Fatigue and Gate Oxide Degradation of SiC MOSFETs |
| title_fullStr | A Dynamic Diagnosis Method for Separating Bond‐Wires Fatigue and Gate Oxide Degradation of SiC MOSFETs |
| title_full_unstemmed | A Dynamic Diagnosis Method for Separating Bond‐Wires Fatigue and Gate Oxide Degradation of SiC MOSFETs |
| title_pt_txt | Um Método de Diagnóstico Dinâmico para Separar Fadiga de Fios de Ligação e Degradação do Óxido de Porta de MOSFETs de SiC |
| title_short | A Dynamic Diagnosis Method for Separating Bond‐Wires Fatigue and Gate Oxide Degradation of SiC MOSFETs |
| title_sort | a dynamic diagnosis method for separating bond‐wires fatigue and gate oxide degradation of sic mosfets |
| topic | Energy General Energy |
| url | https://ietresearch.onlinelibrary.wiley.com/doi/10.1049/pel2.70286?af=R |