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Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature
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| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| Subjects: | |
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| _version_ | 1871837934609498112 |
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| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Journal of the Electron Devices Society |
| description | |
| discipline_display | Electronics |
| discipline_facet | Electronics |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:106769 |
| institution | FRELIP |
| journal_source_facet | IEEE Journal of the Electron Devices Society |
| last_indexed | 2026-07-27T03:42:42.680Z |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature Electronics General Electronics |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Electronics General Electronics |
| subject_facet | Electronics General Electronics |
| title | Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature |
| title_alt | Verificación experimental y modelado analítico del coeficiente de temperatura cero en MOSFETs de medio diamante y diamante bajo alta temperatura Vérification expérimentale et modélisation analytique du coefficient de température nul dans les MOSFET demi-diamant et diamant à haute température Verificação Experimental e Modelagem Analítica do Coeficiente de Temperatura Zero em MOSFETs Meio-Diamante e Diamante sob Alta Temperatura |
| title_auth | Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature |
| title_es_txt | Verificación experimental y modelado analítico del coeficiente de temperatura cero en MOSFETs de medio diamante y diamante bajo alta temperatura |
| title_fr_txt | Vérification expérimentale et modélisation analytique du coefficient de température nul dans les MOSFET demi-diamant et diamant à haute température |
| title_full | Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature |
| title_fullStr | Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature |
| title_full_unstemmed | Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature |
| title_pt_txt | Verificação Experimental e Modelagem Analítica do Coeficiente de Temperatura Zero em MOSFETs Meio-Diamante e Diamante sob Alta Temperatura |
| title_short | Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature |
| title_sort | experimental verification and analytical modeling of the zero temperature coefficient in half-diamond and diamond mosfets under high-temperature |
| topic | Electronics General Electronics |
| url | http://ieeexplore.ieee.org/document/11488733 |