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The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element

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Published in:Measurement Science Review
Format: Online Article RSS Article
Published: 2026
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discipline_display Mathematics
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institution FRELIP
journal_source_facet Measurement Science Review
publishDate 2026
publishDateSort 2026
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spellingShingle The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
Mathematics
General
Mathematics
sub_discipline_display General
sub_discipline_facet General
subject_display Mathematics
General
Mathematics
Mathematics
General
Mathematics
subject_facet Mathematics
General
Mathematics
title The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
title_auth The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
title_full The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
title_fullStr The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
title_full_unstemmed The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
title_short The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
title_sort the uncertainty of the indirect thermographic measurement of the temperature of the semiconductor element
topic Mathematics
General
Mathematics
url https://sciendo.com/article/10.2478/msr-2026-0019